Wednesday April 25th, at the Holiday Inn Express , 700 Central Parkway East, Plano TX 75074.
Here is the link to their site. http://www.ichotelsgroup.com/h/d/ex/1/en/hotel/DALPN?&.
The meeting will be in the Collin Creek Conference room. We will start the meeting at 6:00 pm with a 30 to 45 minutes of social time for food and discussion. We will have the speaker begin around 6:45 pm. This will be a joint meeting of the EDFAS Lone Star Chapter and the North Texas ASM Chapter.
Speaker: Dr. Larry Wagner, past president of EDFAS and the current president of ASM.
Topic: "Materials Analysis in Electronic Devices"
(Click the above link to download presentation)
Abstract: Chemical analysis can play a key role in the understanding the root cause of electronic device failures. The identification of the chemical makeup of particles and contaminants plays a vital role in understanding the sources of these contaminants. This session will provide a basic understanding of the physical principles and examples of applications of the analysis techniques most commonly used in the failure analysis of electronic devices.
The most commonly used technique is Energy Dispersive Analysis which had many advantages for failure analysis. Other techniques such as Auger and X-ray Photoelectron Spectroscopy provide better surface analysis. SIMS is commonly used to provide better sensitivity while techniques like Raman and FTIR provide better identification of organic materials. Other complementary techniques will also be discussed.
Sponsor: Hitachi High Technology
