Gallery
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Jan 2007 Meeting
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meet 3

Microtech Analytical Labs, Plano, Tx, on Wed. Jan 24.

Sponsor:  Rhett Johnson and Peter Carlson of FEI Company

Our Speaker was Dr. Bruce Gnade of the University of Texas at Dallas Nanotechnology group.

Most folks use the nanoprober to measure I-V characteristics of circuits but Dr. Gnade spoke on the use of a nanoprobe inside an SEM to measure the work function of individual grains of metal on gate dielectric using C-V measurements for metal gate applications.

March 2007 Meeting
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gorman&lelandmar
“Atomic Level Characterization of Semiconductor Devices Using Atom Probe Technology”
Held at the University of North Texas, Speaker Dr. Brian Gorman

April 2007 Meeting
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cronynapr
“Materials Analysis in Electronic Devices”
Joint meeting with ASM North Texas Chapter, speaker Dr. Lawrence Wagner, ASM President.  The meeting was hosted by Hitachi High Technologies, Kevin Cronyn.  Hitachi also held demonstrations of their table top SEM at the meeting.

August 2007 M&M Conference
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rob&lcsem
Microscopy & Microanalysis Conference, the image is showing the EDFAS Lone Star Chapter Chair in front of the worlds largest SEM chamber.